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dc.contributor.authorKeller, Reto B.
dc.date.accessioned2025-03-07T16:46:45Z
dc.date.available2025-03-07T16:46:45Z
dc.date.issued2023
dc.date.submitted2022-12-13T12:36:45Z
dc.identifierONIX_20221213_9783031141867_27
dc.identifierhttps://library.oapen.org/handle/20.500.12657/60162
dc.identifier.urihttps://doab-dev.siscern.org/handle/20.500.12854/158870
dc.description.abstractThis open access book provides practicing electrical engineers and students a practical – and mathematically sound – introduction to the topic of electromagnetic compatibility (EMC). The author enables readers to understand better how to overcome commonly failed EMC tests for radiated emission, radiated immunity, and electrostatic discharge (ESD), while providing concrete EMC design guidelines. The book also presents an overview of EMC standards and regulations and how to test for a global market access.
dc.languageEnglish
dc.rightsopen access
dc.subject.otherElectromagnetic Compatibility Engineering
dc.subject.otherEMC for Product Designers
dc.subject.otherShielding of Electromagnetic Waves
dc.subject.otherAerospace Electromagnetic Compatibility
dc.subject.otherEMC Regulations and standards
dc.subject.otherthema EDItEUR::T Technology, Engineering, Agriculture, Industrial processes::TJ Electronics and communications engineering::TJF Electronics engineering::TJFC Electronics: circuits and components
dc.subject.otherthema EDItEUR::T Technology, Engineering, Agriculture, Industrial processes::TJ Electronics and communications engineering::TJF Electronics engineering::TJFN Microwave technology
dc.subject.otherthema EDItEUR::T Technology, Engineering, Agriculture, Industrial processes::TJ Electronics and communications engineering::TJF Electronics engineering
dc.titleDesign for Electromagnetic Compatibility--In a Nutshell
dc.title.alternativeTheory and Practice
dc.typebook
oapen.identifier.doi10.1007/978-3-031-14186-7
oapen.relation.isPublishedBy9fa3421d-f917-4153-b9ab-fc337c396b5a
oapen.relation.isbn9783031141867
oapen.imprintSpringer
oapen.pages416
oapen.place.publicationCham


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