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Breitbandige Frequenzweichen für die Parallelisierung von Millimeterwellen-Messtechnik

dc.contributor.authorKlaus Boes, Florian
dc.date.accessioned2025-03-07T20:46:25Z
dc.date.available2025-03-07T20:46:25Z
dc.date.issued2021
dc.date.submitted2021-07-23T15:11:19Z
dc.identifierONIX_20210723_9783731510789_7
dc.identifierOCN: 1266288264
dc.identifier1868-4696
dc.identifierhttps://library.oapen.org/handle/20.500.12657/50167
dc.identifier.urihttps://doab-dev.siscern.org/handle/20.500.12854/166258
dc.description.abstractThis work describes the novel use of broadband continuous diplexers that could be integrated into on-wafer probes to parallize millimeter wave on-wafer measurement equipment. A model-based method for the efficient design of diplexers with a large number of adjustable parameters allows the realization of a DC – 110 GHz – 170 GHz diplexer for the first time.
dc.languageGerman
dc.relation.ispartofseriesKarlsruher Forschungsberichte aus dem Institut für Hochfrequenztechnik und Elektronik
dc.rightsopen access
dc.subject.classificationthema EDItEUR::T Technology, Engineering, Agriculture, Industrial processes::TH Energy technology and engineering::THR Electrical engineering
dc.subject.otherFrequenzweiche
dc.subject.otherDiplexer
dc.subject.otherMultiplexer
dc.subject.otherFilter
dc.subject.otherMillimeterwellen-Filter
dc.subject.otherdiplexer
dc.subject.othermultiplexer
dc.subject.otherfilter
dc.subject.othermillimeter-wave filter
dc.titleBreitbandige Frequenzweichen für die Parallelisierung von Millimeterwellen-Messtechnik
dc.typebook
oapen.identifier.doi10.5445/KSP/1000128278
oapen.relation.isPublishedBy68fffc18-8f7b-44fa-ac7e-0b7d7d979bd2
oapen.relation.isbn9783731510789
oapen.collectionAG Universitätsverlage
oapen.imprintKIT Scientific Publishing
oapen.pages216
oapen.place.publicationKarlsruhe
peerreview.review.typeFull text
peerreview.anonymityAll identities known
peerreview.reviewer.typeEditorial board member
peerreview.reviewer.typeExternal peer reviewer
peerreview.review.stagePre-publication
peerreview.open.reviewNo
peerreview.publish.responsibilityBooks or series editor
peerreview.id51a542ec-eaeb-47c2-861d-6022e981a97a
dc.seriesnumber41
dc.abstractotherlanguageThis work describes the novel use of broadband continuous diplexers that could be integrated into on-wafer probes to parallize millimeter wave on-wafer measurement equipment. A model-based method for the efficient design of diplexers with a large number of adjustable parameters allows the realization of a DC – 110 GHz – 170 GHz diplexer for the first time.
peerreview.titleDissertations in Series (Dissertationen in Schriftenreihe)


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