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dc.contributor.authorUhlig, David
dc.date.accessioned2025-03-08T06:12:32Z
dc.date.available2025-03-08T06:12:32Z
dc.date.issued2023
dc.date.submitted2023-10-02T11:23:25Z
dc.identifierhttps://library.oapen.org/handle/20.500.12657/76521
dc.identifier.urihttps://doab-dev.siscern.org/handle/20.500.12854/183908
dc.description.abstractOptical measurement methods are becoming increasingly important for high-precision production of components and quality assurance. The increasing demand can be met by modern imaging systems with advanced optics, such as light field cameras. This work explores their use in the deflectometric measurement of specular surfaces. It presents improvements in phase unwrapping and calibration techniques, enabling high surface reconstruction accuracies using only a single monocular light field camera.
dc.languageEnglish
dc.relation.ispartofseriesForschungsberichte aus der Industriellen Informationstechnik
dc.rightsopen access
dc.subject.otherphase unwrapping; camera calibration; light field cameral Phasenentfaltung; Kamerakalibrierung; Lichtfeldkamera; surface reconstruction; deflectometry; Oberflächenrekonstruktion; Deflektometrie
dc.titleLight Field Imaging for Deflectometry
dc.typebook
oapen.identifier.doi10.5445/KSP/1000159372
oapen.relation.isPublishedBy68fffc18-8f7b-44fa-ac7e-0b7d7d979bd2
oapen.pages284
dc.seriesnumber30


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