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dc.contributor.authorLuo, Ding
dc.date.accessioned2025-03-08T10:36:02Z
dc.date.available2025-03-08T10:36:02Z
dc.date.issued2021
dc.date.submitted2021-05-27T09:28:03Z
dc.identifierONIX_20210527_9783731510611_13
dc.identifier1866-5934
dc.identifierhttps://library.oapen.org/handle/20.500.12657/48816
dc.identifier.urihttps://doab-dev.siscern.org/handle/20.500.12854/194934
dc.description.abstractAn adaptive microscope with axial chromatic encoding is designed and developed, namely the AdaScope. With the ability to confocally address any locations within the measurement volume, the AdaScope provides the hardware foundation for a cascade measurement strategy to be developed, dramatically accelerating the speed of 3D confocal microscopy.
dc.languageEnglish
dc.relation.ispartofseriesSchriftenreihe Automatische Sichtprüfung und Bildverarbeitung
dc.rightsopen access
dc.subject.classificationbic Book Industry Communication::U Computing & information technology::UY Computer science::UYA Mathematical theory of computation::UYAM Maths for computer scientists
dc.subject.otherchromatisch
dc.subject.otherkonfokal
dc.subject.other3D Messtechnik
dc.subject.otherMikroskopie
dc.subject.otherchromatic
dc.subject.otherconfocal
dc.subject.other3D measurement technology
dc.subject.othermicroscopy
dc.subject.otherthema EDItEUR::U Computing and Information Technology::UY Computer science::UYA Mathematical theory of computation::UYAM Maths for computer scientists
dc.titleHigh-speed surface profilometry based on an adaptive microscope with axial chromatic encoding
dc.typebook
oapen.identifier.doi10.5445/KSP/1000125427
oapen.relation.isPublishedBy68fffc18-8f7b-44fa-ac7e-0b7d7d979bd2
oapen.relation.isbn9783731510611
oapen.pages202
oapen.place.publicationKarlsruhe
dc.seriesnumber2
dc.anonymityAll identities known
dc.peerreviewid51a542ec-eaeb-47c2-861d-6022e981a97a
dc.peerreviewtitleDissertations in Series (Dissertationen in Schriftenreihe)
dc.openreviewNo
dc.responsibilityBooks or series editor
dc.stagePre-publication
dc.reviewtypeFull text
dc.reviewertypeEditorial board member
dc.reviewertypeExternal peer reviewer


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