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RF Probe-Induced On-Wafer Measurement Errors in the Millimeter-Wave Frequency Range

dc.contributor.authorMüller, Daniel*
dc.date.accessioned2021-02-12T02:16:46Z
dc.date.available2021-02-12T02:16:46Z
dc.date.issued2018*
dc.date.submitted2019-07-28 18:37:01*
dc.identifier34153*
dc.identifier.issn18684696*
dc.identifier.urihttps://directory.doabooks.org/handle/20.500.12854/58448
dc.description.abstractMeasurement at millimeter-wave frequencies are prone to parasitic effects which distort the overall results. Especially the use of RF probes introduces unknown distortions, even after the measurement setup is calibrated. This works investigates these distortions based on electromagnetic field simulations of integrated circuits in conjunction with models of the used RF probes. This allows to comprehend the observed distortions and successfully resolve the root of the distortions.*
dc.languageEnglish*
dc.relation.ispartofseriesKarlsruher Forschungsberichte aus dem Institut für Hochfrequenztechnik und Elektronik*
dc.subjectT1-995*
dc.subject.classificationthema EDItEUR::T Technology, Engineering, Agriculture, Industrial processes::TB Technology: general issuesen_US
dc.subject.otherOn-Wafer Measurements*
dc.subject.otherMonolithic Microwave Integrated Circuits*
dc.subject.otherHalbleiterschaltungen*
dc.subject.otherMesstechnik*
dc.subject.otherHochfrequenztechnik*
dc.subject.otherElectromagnetic Field Simulation*
dc.subject.otherElektromagnetische Feldsimulation*
dc.subject.otherRadio Frequency*
dc.titleRF Probe-Induced On-Wafer Measurement Errors in the Millimeter-Wave Frequency Range*
dc.typebook
oapen.identifier.doi10.5445/KSP/1000084392*
oapen.relation.isPublishedBy68fffc18-8f7b-44fa-ac7e-0b7d7d979bd2*
oapen.relation.isbn9783731508229*
oapen.pagesXII, 180 p.*
oapen.volume89*
peerreview.review.typeFull text
peerreview.anonymityAll identities known
peerreview.reviewer.typeEditorial board member
peerreview.reviewer.typeExternal peer reviewer
peerreview.review.stagePre-publication
peerreview.open.reviewNo
peerreview.publish.responsibilityBooks or series editor
peerreview.id51a542ec-eaeb-47c2-861d-6022e981a97a
peerreview.titleDissertations in Series (Dissertationen in Schriftenreihe)


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