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dc.contributor.authorKrólczyk, Grzegorz*
dc.contributor.authorAntonino Daviu, Jose Alfonso*
dc.contributor.authorGlowacz, Adam*
dc.date.accessioned2021-02-12T03:35:04Z
dc.date.available2021-02-12T03:35:04Z
dc.date.issued2020*
dc.date.submitted2020-04-07 23:07:09*
dc.identifier44806*
dc.identifier.urihttps://directory.doabooks.org/handle/20.500.12854/59360
dc.description.abstractThis Special Issue with 35 published articles shows the significance of the topic “Signal Processing and Analysis of Electrical Circuit”. This topic has been gaining increasing attention in recent times. The presented articles can be categorized into four different areas: signal processing and analysis methods of electrical circuits; electrical measurement technology; applications of signal processing of electrical equipment; fault diagnosis of electrical circuits. It is a fact that the development of electrical systems, signal processing methods, and circuits has been accelerating. Electronics applications related to electrical circuits and signal processing methods have gained noticeable attention in recent times. The methods of signal processing and electrical circuits are widely used by engineers and scientists all over the world. The constituent papers represent a significant contribution to electronics and present applications that can be used in industry. Further improvements to the presented approaches are required for realizing their full potential.*
dc.languageEnglish*
dc.subjectTA1-2040*
dc.subjectT1-995*
dc.subject.classificationthema EDItEUR::T Technology, Engineering, Agriculture, Industrial processes::TB Technology: general issues::TBX History of engineering and technologyen_US
dc.subject.othern/a*
dc.subject.otherfault diagnosis*
dc.subject.otherFPGA*
dc.subject.otherinduction motor*
dc.subject.otherSAR ADC*
dc.subject.otheraccuracy*
dc.subject.otherspectral analysis*
dc.subject.othermulti-sensor fusion*
dc.subject.othertilt sensor*
dc.subject.otherleast squares solution*
dc.subject.othermethod of images*
dc.subject.otherwasps*
dc.subject.otherspatially adapted regularization parameter*
dc.subject.othernoise reduction*
dc.subject.otherphase angle*
dc.subject.otherfault injection*
dc.subject.otherdirect sampling*
dc.subject.otherADMM*
dc.subject.othertransmitter*
dc.subject.otherhardware*
dc.subject.otherfrequency characteristic*
dc.subject.otherreconstruction probability*
dc.subject.otherarray signal processing*
dc.subject.otherbees*
dc.subject.othermultigroup scan*
dc.subject.othertuning*
dc.subject.othermethod*
dc.subject.otherreceiver*
dc.subject.otherunderwater acoustic signal*
dc.subject.otherchannel-selection-embedded bootstrap*
dc.subject.otherdemodulation*
dc.subject.otherlow noise*
dc.subject.othertime delay*
dc.subject.otherlow-cost*
dc.subject.otherinsects*
dc.subject.otherResistance-to-Period converter*
dc.subject.otherfrequency standard comparator*
dc.subject.othersystem errors*
dc.subject.othermicrocontroller*
dc.subject.otherICEEMD*
dc.subject.otherphase-locked loop*
dc.subject.otherbroadband*
dc.subject.otherloop delay circuit*
dc.subject.otherCMOS technology*
dc.subject.otherhierarchical heterogeneous multi-DAG workflow*
dc.subject.otherelectrochemical impedance spectroscopy*
dc.subject.othercompressed sensing*
dc.subject.otherinduced current*
dc.subject.otherpole-frequency*
dc.subject.othere-traps*
dc.subject.otherrod electrode*
dc.subject.otherSupport Vector Machines*
dc.subject.otherratiometric technique*
dc.subject.otherdifferential capacitive sensor*
dc.subject.otherfeature extraction*
dc.subject.othernight vision*
dc.subject.otherintention of movement classification*
dc.subject.otherchebyshev polynomial*
dc.subject.otherRDL*
dc.subject.othertime-interleaved*
dc.subject.otherbinary search*
dc.subject.othercurrent buffer*
dc.subject.otherpower management integrated circuit*
dc.subject.otherinduced charge*
dc.subject.otherdirect digital synthesizer (DDS)*
dc.subject.otherdynamic comparator*
dc.subject.otherchirality*
dc.subject.otherhigh speed*
dc.subject.otherSIMON*
dc.subject.otherduffing chaotic oscillator (DCO)*
dc.subject.otherDAC*
dc.subject.otherdigital image*
dc.subject.otherVMD*
dc.subject.othershort-circuit fault*
dc.subject.othercomparator*
dc.subject.othercommutator motor*
dc.subject.otherfruit flies*
dc.subject.otherpower randomization*
dc.subject.otherShannon entropy*
dc.subject.othersecret image sharing*
dc.subject.otherinterconnect line*
dc.subject.otherADC*
dc.subject.otherautomatic calibration*
dc.subject.othersignal processing*
dc.subject.otherimage fusion*
dc.subject.otherEMG-Signals*
dc.subject.otherLiDAR odometry*
dc.subject.other3D-IC design*
dc.subject.otherphase difference*
dc.subject.othermatrix eigen-perturbation theory*
dc.subject.otherdelay cell*
dc.subject.otheranalog-to-digital converter*
dc.subject.otherbrick-wall filter*
dc.subject.othercurrent mirror*
dc.subject.otherDC–DC converter*
dc.subject.othermeasurement noise suppression*
dc.subject.otherclass AB operation*
dc.subject.otherCramér–Rao bound*
dc.subject.otherimpulse noise*
dc.subject.otherchain matrix*
dc.subject.otherfrequency tuning word (FTW)*
dc.subject.otherstability*
dc.subject.othercolluder attack*
dc.subject.otherrange sensing*
dc.subject.otherresolver*
dc.subject.otherIMF*
dc.subject.otherNILT*
dc.subject.otheracoustic*
dc.subject.othersensor data fusion*
dc.subject.othermultichannel acquisition*
dc.subject.othersimultaneous localization and mapping (SLAM)*
dc.subject.othersuccessive approximation register*
dc.subject.otherpassive resistor*
dc.subject.otherripple voltage measurement*
dc.subject.othercapacitance-to-time conversion*
dc.subject.otherswitched capacitor*
dc.subject.otherheterogeneous earliest finish time*
dc.subject.othervariational mode decomposition (VMD)*
dc.subject.otheroffset calibration*
dc.subject.othercolor palette*
dc.subject.otherlow power*
dc.subject.othersegmented pre-quantization and bypass*
dc.subject.otherquasi floating gate*
dc.subject.otherFresnel lens*
dc.subject.otherLVDS*
dc.subject.otherpeak-ripple estimation*
dc.subject.otherelectrostatic induction*
dc.subject.othercorrelation function*
dc.subject.othership-radiated noise*
dc.subject.otherattenuation*
dc.subject.otherPM/PWM*
dc.subject.otherimpedance spectrometry*
dc.subject.otherTSV noise coupling*
dc.subject.otherultrasonic phased array*
dc.subject.otherChebyshev filter*
dc.subject.othertrue-time-delay*
dc.subject.othertechnique*
dc.subject.otherpermutation entropy (PE)*
dc.subject.otherCMOS*
dc.subject.otherstochastic gradient*
dc.subject.otherimage restoration*
dc.subject.otherdouble rate*
dc.subject.otherasynchronous*
dc.subject.othercomplementary filters*
dc.subject.otherInner and outer product*
dc.subject.otheroptoelectronics*
dc.subject.othersingular value decomposition*
dc.subject.othersignal analysis*
dc.subject.otherrobust read-out circuits*
dc.subject.otherlow-power*
dc.subject.otherHOCTVL1*
dc.subject.otheroverlap-add processing*
dc.subject.otherfuzzy logic*
dc.subject.otherdifferential power analysis (DPA)*
dc.subject.otherrandom noise*
dc.subject.otherwingbeat*
dc.subject.otherdiscrete wavelet transform*
dc.subject.othertensor*
dc.subject.otherintelligent vehicles*
dc.subject.otherestimated sparsity*
dc.subject.otherDoppler shifts*
dc.subject.otherFRA*
dc.subject.otherdirect position determination*
dc.subject.otherdual Mixing Time difference*
dc.subject.otherall-pass filter*
dc.subject.otherAPF*
dc.subject.othern-out-of-n scheme*
dc.subject.otherhigh-speed serial interface*
dc.subject.otherCNFET*
dc.titleSignal Processing and Analysis of Electrical Circuit*
dc.typebook
oapen.identifier.doi10.3390/books978-3-03928-295-1*
oapen.relation.isPublishedBy46cabcaa-dd94-4bfe-87b4-55023c1b36d0*
oapen.relation.isbn9783039282951*
oapen.relation.isbn9783039282944*
oapen.pages604*
oapen.edition1st*


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