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            Nanoparticle Engineering for Chemical-Mechanical Planarization

            Fabrication of Next-Generation Nanodevices

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            Author(s)
            Paik, Ungyu
            Park, Jea-Gun
            Collection
            Knowledge Unlatched (KU)
            Language
            English
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            Abstract
            Increasing reliance on electronic devices demands products with high performance and efficiency. Such devices can be realized through the advent of nanoparticle technology. This book explains the physicochemical properties of nanoparticles according to each step in the chemical mechanical planarization (CMP) process, including dielectric CMP, shallow trend isolation CMP, metal CMP, poly isolation CMP, and noble metal CMP. The authors provide a detailed guide to nanoparticle engineering of novel CMP slurry for next-generation nanoscale devices below the 60nm design rule. This comprehensive text also presents design techniques using polymeric additives to improve CMP performance.
            URI
            https://doab-dev.siscern.org/handle/20.500.12854/192278
            Keywords
            Material Sciences; thema EDItEUR::T Technology, Engineering, Agriculture, Industrial processes::TB Technology: general issues::TBN Nanotechnology
            DOI
            10.1201/9780429291890
            ISBN
            9781000023220, 9780367446062, 9781420059113, 9780429291890, 9781420059137
            Publisher
            Taylor & Francis
            Publisher website
            http://www.taylorandfrancis.com/
            Publication date and place
            2009
            Grantor
            • Knowledge Unlatched
            Imprint
            CRC Press
            • OAPEN harvesting collection

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              This project received funding from the European Union’s Horizon 2020 research and innovation programme under grant agreement No 871069.

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